Sunday, September 21, 2025
``Quantitative Surface Analysis in 3D``
The field of surface analysis continues to evolve with groundbreaking developments that enhance our ability to characterize materials with unprecedented precision. QSA19 will focus on the challenges and advancements in Quantitative Surface Analysis in 3D, addressing the critical need for accurate depth and three-dimensional compositional analysis. Recent innovations in surface characterization techniques have expanded the capabilities of surface analysis beyond traditional 2D characterization. However, these advancements also present new challenges in quantification, reproducibility, and data interpretation. QSA19 will provide a platform to explore best practices for depth-profiling, data calibration, and 3D reconstruction techniques. Real-world applications and case studies will be presented, ensuring ample opportunities for discussion and engagement. Join us at QSA19 as we tackle the complexities of 3D quantitative surface analysis and drive the field forward.
Invited speakers include:
• Mary Kraft (University of Illinois, Urbana-Champain): Quantitative TOF-SIMS
• Baptiste Gault (Max-Planck Institut für Eisenforschung GmbHIonTOF): 3D Quantification of Atom Probe Tomography
• Jonas Baltrusaitis (Lehigh University): Quantitation of Imaging XPS
• Jonathan Coleman (Trinity College Dublin): Quantitative analysis using High-Resolution 3D FIB-SEM
Contributed posters are being accepted and encouraged, contact Jeff Terry (jeff_terry@avs.org) to submit a poster.