The EL Group integrates themes ranging from classical materials science and thin film characterization to nanometer-scale science and novel optical sensing concepts. We will host oral sessions dedicated to traditional applications of spectroscopic ellipsometry in optical materials and thin film characterization as well as new and emerging topics as well as a poster session. The aim of the Spectroscopic Ellipsometry group is to improve accessibility of this conference for undergraduate and graduate students. To this end, we have worked with our industry partners to establish funding to offset the registration costs of students. Additionally, the J.A. Woollam Co. continues to proudly sponsor the Outstanding Student Oral Award as well as the Outstanding Student Poster Award.
Areas of Interest: Topics will consist of themes ranging from ellipsometric application to classical materials science and thin film characterization to nanometer-scale science and novel optical sensing concepts, which include:
- Quantum and novel materials characterization using ellipsometry
- Methodology and ellipsometric data acquisition
- Integrating theory and advanced computation with ellipsometry
- Integrating ellipsometry with material deposition
EL1: Spectroscopic Ellipsometry Oral Session
Invited Speakers:
- Carlos Armenta, New Mexico State University, “Band Filling and Relaxation Effects in Semiconductors Using Ultrafast Spectroscopic Ellipsometry”
- Tino Hoffmann, University of North Carolina at Charlotte
- Gerald Jellison, Oak Ridge National Laboratory, “Crystal Symmetry and Spectroscopic Ellipsometry”
- Marcel Junige, University of Colorado at Boulder, “In-Situ Spectroscopic Ellipsometry Studies of Selective Thermal Dry Etching”
- Ufuk Kilic, University of Nebraska – Lincoln
EL2: Spectroscopic Ellipsometry Poster Session