The AS Division provides a world-leading forum for the design and characterization of the surfaces and interfaces that underpin technologies ranging from medical implants to electronic devices. The session topics include the popular “Quantitative Surface Analysis” session which offers comprehensive insight and discussion into quantitative analysis. This year, we provide a special focus on “The Power of SIMS”, highlighting recent innovations and developments in this widely-used method. The “Theory for Surface Processes” session provides greater detail on the extraction of chemical and physical information from core-level spectroscopies with a particular concern for the electronic structure of the systems. The “Characterization of Energy Materials” session addresses both the fundamental and practical surface analytical science of next-generation devices including batteries and electrode materials to support innovation in sustainable technologies. The “Data Handling and AI” session covers up-and-coming topics about the needs for fair and transparent data sharing and methods to speed up the translation of data into relevant information. The topics flow seamlessly into the “Complementary Methods and Industrial Challenges” session where perspectives on practical approaches for problem-solving are discussed in the context of emerging industrial needs. The Applied Surface Science Poster Session will capture condensed highlights on all of these subjects on Thursday evening.
The division will hold its annual Business Meeting and Awards Ceremony on Tuesday evening. Highlights of this event include the student award competition and the ASTM E42 Committee on Surface Analysis forum. All members of the Applied Surface Science community are invited to attend.
Areas of Interest: AS is seeking abstracts in areas including, but not limited to:
AS+BI+CA-MoM: The Power of SIMS
- Ian Gilmore, National Physical Laboratory, U.K., “AVS Medard Welch Award Talk: High Resolution Molecular Imaging by Mass Spectrometry – The OrbiSIMS Odyssey”
- David Scurr, University of Nottingham, UK, “ASSD Peter Sherwood Award Talk”
- Hua Tian, University of Pittsburgh, “Delineating Spatial Cellular Complexities Using Multi-omics Approach by GCIB-SIMS”
AS-MoA: Quantitative Surface Analysis I
- Ben Spencer, The University of Manchester, UK, “Quantified Photoemission Using Ga Kα (9.25 keV) Hard X-Rays Applied to Advanced Materials”
AS-TuM: Surface Characterization of Energy Materials
- Steven P. Harvey, NREL, “Solar Energy from a Big Picture Perspective to Nanoscale Insights via TOF-SIMS”
AS-TuA: Theory and Data
- Paul S. Bagus, University of North Texas, “Distinguishing the XPS of Surface and Bulk Atoms”
- Alex Henderson, University of Manchester, UK, “Benefits of a Modern File Format for ToF-SIMS Imaging”
- Jeffry Kelber, University of North Texas, “Theory as a Guide to Electrocatalysis: An Experimentalist’s Point of View”
AS-WeM: Quantitative Surface Analysis II
- Rita Tilmann, IMEC Belgium, “Challenges in Next Generation Semiconductor Devices: Insights by Tof-Sims”
- Christophe Vallée, University at Albany-SUNY, “In situ and quasi-in situ characterization techniques for atomic-scale process development in device fabrication: focus on Area Selective Deposition process”
AP+PS+TF-WeA: Thermal and Plasma enhanced Atomic Layer Etching
AS-ThP: Applied Surface Science Poster Session